Publications [#314102] of Henry Everitt

Papers Published
  1. Webb-Wood, G; Özgür, U; Everitt, HO; Yun, F; Morkoç, H, Measurement of AlxGa1-xN Refractive Indices, in Physica Status Solidi A-Applications And Materials Science, Physica Status Solidi (A) Applied Research, vol. 188 no. 2 (November, 2001), pp. 793-797, WILEY-V C H VERLAG GMBH [Gateway.cgi], [doi] .

    Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic AlxGa1-xN epitaxial layers with 0 ≤ x ≤ 1.0 throughout the visible wavelength region 457 nm < λ < 800 nm. The dispersion, measured by a prism coupling waveguide technique is found to be well described by a first-order Sellmeier dispersion formula parameterized as functions of x and λ.