Vahid Tarokh, Rhodes Family Professor of Electrical and Computer Engineering and Professor of Mathematics and Computer Science

Vahid Tarokh

Vahid Tarokh’s research is in pursuing new formulations and approaches to getting the most out of datasets. Current projects are focused on representation, modeling, inference and prediction from data such as determining how different people will respond to exposure to certain viruses, predicting rare events from small amounts of data, formulation and calculation of limits of learning from observations, and prediction of a macaque monkey's future actions from its brain waves.

Office Location:  
Office Phone:  (919) 660-5252
Email Address: send me a message
Web Page:  http://www.duke.edu/~vt45

Recent Publications

  1. Ding, J; Tarokh, V; Yang, Y, Model Selection Techniques: An Overview, Ieee Signal Processing Magazine, vol. 35 no. 6 (November, 2018), pp. 16-34, Institute of Electrical and Electronics Engineers (IEEE) [doi]  [abs]
  2. Shahrampour, S; Noshad, M; Ding, J; Tarokh, V, Online Learning for Multimodal Data Fusion With Application to Object Recognition, Ieee Transactions on Circuits and Systems Ii: Express Briefs, vol. 65 no. 9 (September, 2018), pp. 1259-1263, Institute of Electrical and Electronics Engineers (IEEE) [doi]
  3. Magnusson, S; Enyioha, C; Li, N; Fischione, C; Tarokh, V, Communication Complexity of Dual Decomposition Methods for Distributed Resource Allocation Optimization, Ieee Journal of Selected Topics in Signal Processing, vol. 12 no. 4 (August, 2018), pp. 717-732, Institute of Electrical and Electronics Engineers (IEEE) [doi]
  4. Banerjee, T; Whipps, G; Gurram, P; Tarokh, V, Sequential Event Detection Using Multimodal Data in Nonstationary Environments, 2018 21st International Conference on Information Fusion (Fusion) (July, 2018), pp. 1940-1947, IEEE [doi]  [abs]
  5. Banerjee, T; Choi, J; Pesaran, B; Ba, D; Tarokh, V, Classification of Local Field Potentials using Gaussian Sequence Model, 2018 Ieee Statistical Signal Processing Workshop (Ssp) (June, 2018), pp. 218-222, IEEE [doi]  [abs]