Papers Published

1. Sarunic, M.V. and Weinberg, S. and Izatt, J.A., Full-field swept-source phase microscopy, Opt. Lett. (USA), vol. 31 no. 10 (2006), pp. 1462 - 4 [OL.31.001462] .
   (last updated on 2007/04/13)

   Abstract:
   We present a full-field phase microscopy technique for quantitative nanoscale surface profiling of samples in reflection. This technique utilizes swept-source optical coherence tomography in a full-field common path interferometer for phase-stable cross-sectional acquisition without scanning. Subwavelength variations in surface sample features are measured without interference from spurious reflections by processing the interferometric phase at a selected depth plane, providing a 1.3 nm stability for high signal-to-noise ratio surface features. Nanoscale imaging was demonstrated by measuring the location of receptor sites on a DNA assay biochip and the surface topography of erythrocytes in a blood smear

   Keywords:
   blood;DNA;light interferometers;nanotechnology;optical microscopy;optical tomography;surface topography;