Papers Published

1. Twyford, E.J. and Jokerst, N.M. and Kohl, P.A., Submicron diffraction gratings etched on an InP/InGaAsP waveguide edge for wavelength division multiplexing, Proc. SPIE - Int. Soc. Opt. Eng. (USA), vol. 2240 (1994), pp. 217 - 26 .
   (last updated on 2007/04/16)

   Abstract:
   Two-dimensional monolithic grating spectrometers for dense wavelength division multiplexing (WDM) show considerable promise to extend the usable bandwidth of optical fibers. Their performance is fundamentally dictated by the grating which is used. First order gratings will theoretically improve the performance of monolithic WDM devices, since WDM devices based on first order gratings do not suffer from an inherent tradeoff between efficiency and broadband operation. First order diffraction gratings which are directly etched onto the cleaved edge of an InGaAsP/InP slab waveguide are reported herein for the first time. A single step holographic photoelectrochemical etch was used to fabricate 0.49 μm period corrugation gratings, which demonstrates first order gratings for wavelength demultiplexers operating in the 155 μm wavelength band. It is shown gratings can be etched on to the vertical wall of a waveguide whose dimensions are 1/5^th to 1/18^th that of previously reported gratings on a vertical wall

   Keywords:
   etching;gallium arsenide;gallium compounds;holographic gratings;III-V semiconductors;indium compounds;optical waveguides;spectrometer accessories;wavelength division multiplexing;