- Peterson, M.J. and Cocks, F.H., Tellurium selective absorber surfaces,
Mater. Sci. Eng. (Switzerland), vol. 41 no. 1
pp. 143 - 7 [0025-5416(79)90054-5] .
(last updated on 2007/04/10)
Tellurium was gas evaporated in both argon and air at pressures of 1 and 7 Torr onto highly specular substrates, and the selective absorber characteristics of the resulting films were studied. In many instances the tellurium thin films manifested absorptivities in excess of 97% and emissivities as low as 4%. Maximum a/e values of 22 were obtained for tellurium films deposited onto silver in air at a pressure of 1 Torr
elemental semiconductors;emissivity;light absorption;scanning electron microscope examination of materials;semiconductor thin films;tellurium;