- Cocks, F.H. and Gettliffe, R., Total external X-ray reflection: a novel method of surface chemical analysis,
Mater. Lett. (Netherlands), vol. 3 no. 4
pp. 133 - 6 [0167-577X(85)90144-2] .
(last updated on 2007/04/10)
Reflected X-ray intensity as a function of angle near the critical angle for total external reflection is used to determine the surface composition of amorphous Se-Te thin films. With the choice of appropriate wavelengths, the method is applicable to a wide variety of amorphous or crystalline films
chalcogenide glasses;selenium compounds;surface structure;tellurium compounds;X-ray chemical analysis;X-ray reflection;