Papers Published

  1. Cocks, F.H. and Peterson, M.J. and Jones, P.L., The dependence of the texture of tellurium thin films on vacuum deposition angle, Thin Solid Films (Switzerland), vol. 70 no. 2 (1980), pp. 297 - 301 [0040-6090(80)90369-7] .
    (last updated on 2007/04/10)

    Abstract:
    Vacuum-deposited tellurium thin films can show substantially different surface morphologies depending on the angle with which the vapor stream impinges on the substrate surface. These tellurium thin films have a tendency to grow as acicular crystallites but as the deposition angle is increased so that the vapor stream becomes tangential to the substrate surface the spacing between crystallites increases and approaches, at stream angles of approximately 80° from the normal, dimensions roughly once or twice the average wavelength of visible light. Such films may have application in solar energy collector systems because of the high absorptivity of sunlight shown by such films. Mechanisms which describe the tendency for crystallite spacing to increase with increasing angle are discussed

    Keywords:
    elemental semiconductors;scanning electron microscope examination of materials;semiconductor thin films;surface structure;tellurium;vacuum deposited coatings;