Papers Published

  1. Cocks, F.H. and Pollock, J.T.A., The ion implantation of helium into gold. A combined X-ray reflection spectroscopy and Rutherford backscattering study, Phys. Status Solidi A (East Germany), vol. 95 no. 1 (1986), pp. 141 - 8 .
    (last updated on 2007/04/10)

    Abstract:
    Two methods are used to investigate the very near surface (0 to 10 nm) effect of 3 keV helium implantation into evaporated gold films. X-ray reflection spectroscopy is used to determine the change in density of the implanted layer and Rutherford backscattering to determine helium concentrations; a maximum of 3.3 He atoms per metal vacancy is reported for a fluence of 4.0×1016 atoms cm-2. The data support the proposition that for implant conditions below those required for exfoliation, there are helium pressures well in excess of 100 kbar within implantation induced voids

    Keywords:
    density of solids;gold;helium;ion implantation;metallic thin films;particle backscattering;vacancies (crystal);vacuum deposited coatings;voids (solid);X-ray reflection;