- Cocks, F.H. and Das, B.N. and Wolff, G.A., Laser reflectogram method for study of crystal surfaces and epitaxial deposits,
Journal of Materials Science, vol. 2 no. 5
pp. 470 - 473 [BF00562953] .
(last updated on 2007/04/10)
When collimated beam of light is reflected from etched crystal surface or epitaxial deposit, pattern formed by this reflection provides information on microscopic morphology of reflecting surface; using He/Ne laser as source of high-intensity collimated light, both SiC etched in CIF3 and cubic CdS grown epitaxially on GaP have been examined; certain regions of SiC were found to give rise to diffraction effects in resulting reflectogram; epitaxial layer of CdS was found to show threefold symmetry and negligible diffraction effect.