Papers Published

  1. Bower, Christopher A. and Gilchrist, Kristin H. and Piascik, Jeffrey R. and Stoner, Brian R. and Natarajan, Srividya and Parker, Charles B. and Wolter, Scott D. and Glass, Jeffrey T., On-chip electron-impact ion source using carbon nanotube field emitters, Applied Physics Letters, vol. 90 no. 12 (March, 2007), pp. 124102 - [1.2715457] .
    (last updated on 2012/07/09)

    A lateral on-chip electron-impact ion source utilizing a carbon nanotube field emission electron source was fabricated and characterized. The device consists of a cathode with aligned carbon nanotubes, a control grid, and an ion collector electrode. The electron-impact ionization of He, Ar, and Xe was studied as a function of field emission current and pressure. The ion current was linear with respect to gas pressure from 10-4 to 10-1 Torr. The device can operate as a vacuum ion gauge with a sensitivity of approximately 1 Torr-1. Ion currents in excess of 1 μA were generated. © 2007 American Institute of Physics.

    Carbon nanotubes;Cathodes;Electric currents;Electron sources;Impact ionization;Microprocessor chips;