- Williams, Brad, E. and Glass, Jeffrey, T. and Davis, Robert, F., Defect and interface structures of diamond thin films,
R&D, Research and Development (Kobe Steel, Ltd), vol. 42 no. 2
pp. 13 - 16 .
(last updated on 2007/04/17)
Diamond films grown by microwave plasma CVD have been examined by Transmission Electron Microscopy (TEM) and High Resolution TEM (HRTEM). It was found that columnar growth of polycrystalline grain structure, twins, stacking faults, dislocations and intermediate layers were characteristic of the diamond films.
Films - Defects;Films - Structure;Films - Chemical Vapor Deposition;Films - Growing;Microscopic Examination - Transmission Electron Microscopy;