Papers Published

1. Tan, T.Y. and Sass, S.L. and Balluffi, P.W., The detection of the periodic structure of high-angle twist boundaries. II. High resolution electron microscopy study, Philos. Mag. (UK), vol. 31 no. 3 (1975), pp. 575 - 85 .
   (last updated on 2007/04/10)

   Abstract:
   For pt.I see ibid., vol.31, no.3, p.559 (1975). High-resolution electron microscopy was used to image directly the O-lattice of ⟨001⟩ twist boundaries with misorientations up to 25° and O-lattice spacings as small as 7 Å. The results were entirely consistent with the conclusions reached on the basis of the diffraction experiments described in Part I. An experimental method was devised for determining whether the O-lattice was imaged by conventional diffraction strain contrast or by interference strain contrast which arises from interference between f.c.c. and O-reflections resulting from the periodic structure of the boundary (Part I). It was demonstrated that spacings down to about 34 Å were imaged mainly by means of interference strain contrast. Efforts were also made to detect secondary grain boundary dislocation networks, and such networks were observed in the vicinity of the Σ=5 boundary over a slightly larger range of misorientations than had been detected previously

   Keywords:
   dislocations;electron microscopy;grain boundaries;