Papers Published

  1. Tan, T. Y. and Sass, S. L. and Balluffi, R. W., DETECTION OF THE PERIODIC STRUCTURE OF HIGH-ANGLE TWIST BOUNDARIES EM DASH 2. HIGH RESOLUTION ELECTRON MICROSCOPY STUDY., Philosophical Magazine, vol. 31 no. 3 (1975), pp. 575 - 585 .
    (last updated on 2007/04/10)

    High-resolution electron microscopy was used to image directly the 0-lattice of certain twist boundaries with misorientations up to 25 degree and 0-lattice spacings as small as 7 A. The results were entirely consistent with the conclusions reached on the basis of the diffraction experiments described in Part I. An experimental method was devised for determining whether the 0-lattice was imaged by conventional diffraction strain contrast or by interference strain contrast which arises from interference between f. c. c. and 0-reflections resulting from the periodic structure of the boundary. Efforts were also made to detect secondary grain boundary dislocation networks.