Papers Published

1. Sabol, JM; Avinash, GB; Nicolas, F; Claus, B; Zhao, J; Dobbins, JT, The development and characterization of a dual-energy subtraction imaging system for chest radiography based on CsI:Tl amorphous silicon flat-panel technology, Smart Structures and Materials 2005: Active Materials: Behavior and Mechanics, vol. 4320 (January, 2001), pp. 399-408, SPIE [12.430897], [doi] .
   (last updated on 2023/06/01)

   Abstract:
   Dual-energy subtraction imaging increases the sensitivity and specificity of pulmonary nodule detection in chest radiography by reducing the contrast of overlying bone structures. A prototype dual-energy system which enables rapid, dual-exposure imaging of the chest using a commercially available high-efficiency, flat-panel x-ray detector was constructed. As such, the quality of the clinical images generated with this prototype exceeds that of CR techniques and demonstrates the potential for improved detection and characterization of lung disease through dual-energy imaging.

   Keywords:
   amorphous semiconductors;caesium compounds;diagnostic radiography;image sensors;lung;medical image processing;silicon;solid scintillation detectors;thallium;X-ray detection;