Papers Published

1. Dagnall, G. and Stock, S.R. and Brown, A.S., Growth of InAsP/InP quantum wells by solid source MBE on misoriented and exact InP (1 1 1)B: Substrate temperature and arsenic species effects, Journal of Crystal Growth, vol. 201-202 (1999), pp. 242 - 247 [S0022-0248(98)01330-X] .
   (last updated on 2007/04/14)

   Abstract:
   Two series of strained InAsP/InP multiquantum wells (MQWs) were grown by solid source molecular beam epitaxy (SSMBE) simultaneously on Fe-doped InP substrates with a growth orientation of either (1 0 0), exact (1 1 1)B, and (1 1 1)B misoriented 1° toward [Left Angle Bracket] -2 1 1 [Right Angle Bracket] . The MQWs were grown using either dimer or tetramer arsenic (As₂ or As₄) over a substrate temperature range of 420-535 °C. The θ-2θ X-ray diffraction measurements, the atomic force microscopy (AFM) images of the surfaces, and the 8 K photoluminescence (PL) full-width at half-maximum (FWHM) values of the (1 1 1)B samples showed general improvement in the samples' material properties with increasing substrate temperature. While the X-ray diffraction measurements and the AFM images showed little difference between As₂ and As₄, the 8 K PL FWHM values varied greatly with respect to the arsenic species used. The exact (1 1 1)B samples had narrower 8 K PL FWHM values when grown with As₂. For growth on misoriented (1 1 1)B InP, the 8 K FWHM values narrowed with As₄. The misoriented (1 1 1)B samples had the narrowest 8 K PL FWHM when grown with As₄ at a temperature of 520 °C; the exact (1 1 1)B at 495 °C when grown with As₂.

   Keywords:
   Semiconductor quantum wells;Semiconducting indium phosphide;Molecular beam epitaxy;Substrates;Crystal orientation;X ray diffraction analysis;Atomic force microscopy;Photoluminescence;