Publications by Krishnendu Chakrabarty.

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Papers Published

  1. Kavousianos, X; Chakrabarty, K, Recent advances in single- and multi-site test optimization for DVS-based SoCs, Proceedings 2014 9th Ieee International Conference on Design and Technology of Integrated Systems in Nanoscale Era, Dtis 2014 (January, 2014), IEEE [doi] .
    (last updated on 2022/12/30)

    Abstract:
    Dynamic voltage scaling (DVS) combined with the partitioning of the System-on-Chip (SoC) into multiple voltage islands constitutes a powerful dynamic-power minimization technique. However, the sharing of the test-access mechanisms (TAMs) among different voltage islands, the necessity to test every core at multiple voltage levels and the low shift-frequency limits at the lower voltage levels introduce new test challenges and dramatically increase testing time. In this paper, we unfold challenges related to scheduling tests for DVS-based SoCs, and we describe recent advances for minimizing the test time, especially in multi-site-test environments. © 2014 IEEE.