Papers Published

1. Liu, C; Chakrabarty, K, A partition-based approach for identifying failing scan cells in scan-BIST with applications to system-on-chip fault diagnosis, Proceedings Design, Automation and Test in Europe, Date (December, 2003), pp. 230-235, IEEE Comput. Soc [Gateway.cgi], [doi] .
   (last updated on 2022/12/30)

   Abstract:
   We present a new partition-based fault diagnosis technique for identifying failing scan cells in a scan-BIST environment. This approach relies on a two-step scan chain partitioning scheme. In the first step, an interval-based partitioning scheme is used to generate a small number of partitions, where each element of a partition consists of a set of scan cells. In the second step, additional partitions are created using an earlier-proposed random-selection partitioning method. Two-step partitioning leads to higher diagnostic resolution than a scheme that relies only on random-selection partitioning, with only a small amount of additional hardware. The proposed scheme is especially suitable for a system-on-chip (SOC) composed of multiple embedded cores, where test access is provided by means of a TestRail that is threaded through the internal scan chains of the embedded cores. We present experimental results for the six largest ISCAS-89 benchmark circuits and for two SOCs crafted from some of the ISCAS-89 circuits. © 2003 IEEE.