Papers Published

1. Chandra, A; Chakrabarty, K, Reduction of SOC test data volume, scan power and testing time using alternating run-length codes, Proceedings Design Automation Conference (January, 2002), pp. 673-678 [doi] .
   (last updated on 2022/12/30)

   Abstract:
   We present a test resource partitioning (TRP) technique that simultaneously reduces test data volume, test application time and scan power. The proposed approach is based on the use of alternating run-length codes for test data compression. Experimental results for the larger ISCAS-89 benchmarks and an IBM production circuit show that reduced test data volume, test application time and low power scan testing can indeed be achieved in all cases.