Papers Published

1. Rosinger, P; Al-Hashimi, B; Chakrabarty, K, Rapid generation of thermal-safe test schedules, Proceedings Design, Automation and Test in Europe, Date, vol. II (December, 2005), pp. 840-845, IEEE [doi] .
   (last updated on 2022/12/30)

   Abstract:
   Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently been proposed to tackle this problem. However, as it will be shown in this paper, imposing a chip-level maximum power constraint doesn't necessarily avoid local overheating due to the non-uniform distribution of power across the chip. This paper proposes a new approach for dealing with overheating during test, by embedding thermal awareness into test scheduling. The proposed approach facilitates rapid generation of thermal-safer test schedules without requiring time-consuming thermal simulations. This is achieved by employing a lowcomplexity test session thermal model used to guide the test schedule generation algorithm. This approach reduces the chances of a design re-spin due to potential overheating during test.