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Papers Published
- Zhao, Y; Chakrabarty, K, Fault diagnosis for lab-on-chip using digital microfluidic logic gates,
2008 Ieee 14th International Mixed Signals, Sensors, and Systems Test Workshop, Ims3tw
(September, 2008), IEEE [doi] .
(last updated on 2022/12/30)Abstract:
Dependability is an important system attribute for microfluidic lab-on-chip systems. Robust testing and diagnosis methods are therefore needed for a lab-on-chip. Previously proposed techniques for reading test outcomes and for pulse-sequence analysis are cumbersome and error-prone. We present a fault diagnosis method to locate a single defective cell and multiple rows/columns with defective cells in a digital microfluidic array. This method utilizes digital microfluidic exclusive-or gates to implement an output compactor. The microfluidic compactor can compress 2r distinct test outcomes to a r-droplet signature. This approach obviates the need for capacitive sensing test-outcome circuits for analysis.