Papers Published

1. Larsson, A; Xin, Z; Larsson, E; Chakrabarty, K, SOC test optimization with compression-technique selection, Proceedings International Test Conference (December, 2008), IEEE [doi] .
   (last updated on 2022/12/30)

   Abstract:
   The increasing test-data volumes needed for the testing of system-on-chip (SOC) lead to long test times and high memory requirements. We present an analysis to highlight the fact that the impact of a test-data compression technique on test time and compression ratio are methoddependant as well as TAM-width dependant. Therefore, we propose a technique where compression-tachnique selection is integrated with core wrapper design, test architecture design, and test scheduling to minimize the SOC test time and the test-data volume. © 2008 IEEE.