Papers Published

1. Peng, K; Yilmaz, M; Chakrabarty, K; Tehranipoor, M, A noise-aware hybrid method for SDD pattern grading and selection, Proceedings of the Asian Test Symposium (December, 2010), pp. 331-336, IEEE [doi] .
   (last updated on 2022/12/30)

   Abstract:
   Testing for small-delay defects (SDDs) is necessary for ensuring product quality in smaller technology nodes. Current tools such as transition-delay fault (TDF) ATPGs and timing-aware ATPGs are either inefficient in detecting SDDs or suffering from large pattern count and CPU runtime. Furthermore, none of these methodologies take into account the impact of pattern-induced noises, e.g., power supply noise (PSN) and crosstalk, which are potential sources of SDDs. In this paper, we present a hybrid method considering the impacts of pattern-induced noises to grade and select the most effective patterns for detecting SDDs. The grading procedure is performed on a large repository of patterns generated by n-detect TDF ATPG. Top-off ATPG is performed after pattern selection to achieve the same fault coverage as that for timing-aware ATPG. The experimental results demonstrate the efficiency of our proposed method; it results in a pattern count close to 1-detect ATPG while sensitizes similar or greater number of long paths than the commercial timing-aware ATPG pattern set. © 2010 IEEE.