Papers Published

1. Zhao, Y; Chakrabarty, K, Fault diagnosis in lab-on-chip using digital microfluidic logic gates, Journal of Electronic Testing: Theory and Applications (Jetta), vol. 27 no. 1 (February, 2011), pp. 69-83, Springer Nature [doi] .
   (last updated on 2022/12/30)

   Abstract:
   Fault diagnosis is needed for a lab-on-chip to facilitate defect tolerance using reconfiguration. Previously proposed techniques for reading test outcomes and for pulse-sequence analysis are cumbersome and error-prone. We present a fault-diagnosis method to locate a single defective cell and multiple rows/columns with defective cells in a digital microfluidic array. The proposed method can also locate an unknown number of rows/columns-under-test with defective cells. It utilizes digital microfluidic exclusive-or gates to implement an output compactor. The microfluidic compactor can compress 2 r distinct test outcomes to a r-droplet signature. This approach obviates the need for capacitive sensing test-outcome circuits for analysis. We analyze the probability of misdiagnosis and use the compression ratio as a measure to evaluate the proposed fault-diagnosis method. © 2010 Springer Science+Business Media, LLC.