Papers Published

1. Yilmaz, M; Tehranipoor, M; Chakrabarty, K, A metric to target small-delay defects in industrial circuits, Ieee Design & Test of Computers, vol. 28 no. 2 (March, 2011), pp. 52-61, Institute of Electrical and Electronics Engineers (IEEE) [doi] .
   (last updated on 2022/12/30)

   Abstract:
   Timing-related defects are a major cause of test escapes and field returns for very deep-submicron (VDSM) integrated circuits. Small-delay variations induced by crosstalk, process variations, power supply noise, and resistive opens and shorts can cause timing failures in a design, leading to quality and reliability concerns. This article describes the authors' work with a previously proposed test-grading technique that uses output deviations for screening small-delay defects. © 2011 IEEE.