Papers Published

1. Gu, X; Rearick, J; Eklow, B; Keim, M; Qian, J; Jutman, A; Chakrabarty, K; Larsson, E, Re-using chip level DFT at board level, Proceedings 2012 17th Ieee European Test Symposium, Ets 2012 (August, 2012), IEEE [doi] .
   (last updated on 2022/12/30)

   Abstract:
   As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems? © 2012 IEEE.