Papers Published

1. Fang, H; Chakrabarty, K; Jas, A; Patil, S; Tirumurti, C, Functional test-sequence grading at register-transfer level, Ieee Transactions on Very Large Scale Integration (Vlsi) Systems, vol. 20 no. 10 (January, 2012), pp. 1890-1894, Institute of Electrical and Electronics Engineers (IEEE) [repository], [doi] .
   (last updated on 2022/12/30)

   Abstract:
   We propose output deviations as a surrogate metric to grade functional test sequences at the register-transfer level without explicit fault simulation. Experimental results for the open-source Biquad filter core and the Scheduler module of the Illinois Verilog Model show that the deviations metric is computationally efficient and it correlates well with gate-level coverage for stuck-at, transition-delay and bridging faults. Results also show that functional test sequences reordered based on output deviations provide steeper gate-level fault coverage ramp-up compared to other ordering methods. © 2011 IEEE.