Papers Published

1. Chakrabarty, K; Murray, BT; Liu, J; Zhu, M, Test width compression for built-in self testing, Proceedings International Test Conference (December, 1997), pp. 328-337, Int. Test Conference [doi] .
   (last updated on 2022/12/30)

   Abstract:
   We present a method for designing test generator circuits (TGCs) that incorporate a precomputed test set TD in the patterns they produce. Our method uses width compression based on the property of d-compatibles, which allows us to encode TD more efficiently than previous methods that use only compatibles and inverse compatibles. The TGC consists of a counter, which generates a set of encoded test patterns, and a decompression circuit consisting of simple binary decoders that generate a final sequence containing TD. These TGCs are applicable to embedded-core circuits whose detailed designs are not available. We demonstrate the effectiveness of our approach by presenting experimental results for the ISCAS 85 and ISCAS 89 benchmark circuits.