Papers Published

1. Chandra, A; Chakrabarty, K, A unified approach to reduce SOC test data volume, scan power and testing time, Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems, vol. 22 no. 3 (March, 2003), pp. 352-362, Institute of Electrical and Electronics Engineers (IEEE) [doi] .
   (last updated on 2022/12/30)

   Abstract:
   We present a test resource partitioning (TRP) technique that simultaneously reduces test data volume, test application time, and scan power. The proposed approach is based on the use of alternating run-length codes for test data compression. We present a formal analysis of the amount of data compression obtained using alternating run-length codes. We show that a careful mapping of the don't-cares in precomputed test sets to 1's and 0's leads to significant savings in peak and average power, without requiring either a slower scan clock or blocking logic in the scan cells. We present a rigorous analysis to show that the proposed TRP technique reduces testing time compared to a conventional scan-based scheme. We also improve upon prior work on run-length coding by showing that test sets that minimize switching activity during scan shifting can be more efficiently compressed using alternating run-length codes. Experimental results for the larger ISCAS89 benchmarks and an IBM production circuit show that reduced test data volume, test application time, and low power-scan testing can indeed be achieved in all cases.