Publications by Krishnendu Chakrabarty.

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Papers Published

  1. Lee, HHS; Chakrabarty, K, Test challenges for 3D integrated circuits, Ieee Design & Test of Computers, vol. 26 no. 5 (November, 2009), pp. 26-35, Institute of Electrical and Electronics Engineers (IEEE) [doi] .
    (last updated on 2022/12/30)

    Abstract:
    Editor's note:One of the challenges for 3D technology adoption is the insufficient understanding of 3D testing issues and the lack of DFT solutions. This article describes testing challenges for 3D ICs, including problems that are unique to 3D integration, and summarizes early research results in this area. © 2009 IEEE.

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