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Papers Published
- Vartziotis, F; Kavousianos, X; Georgiou, P; Chakrabarty, K, Test-access-mechanism optimization for multi-Vdd SoCs,
Proceedings International Test Conference, vol. 2015-November
(November, 2015), IEEE [doi] .
(last updated on 2022/12/30)Abstract:
The use of multiple voltage levels introduces new challenges for testing Multi-Vdd SoCs. Time-Division-Multiplexing (TDM) tackles many of these challenges and offers very effective test-schedules. However, the effectiveness of TDM for minimizing test time depends on the Test-Access-Mechanism (TAM) in the SoC. Single-Vdd TAM optimization techniques consider neither the highly constrained test environment of multi-Vdd SoCs nor the benefits provided by TDM, therefore they are not suitable for multi-Vdd SoCs. In this paper, we propose the first TAM optimization technique for multi-Vdd SoCs. The proposed method exploits unique scheduling opportunities and flexibility offered by TDM, and by the means of a Branch-Bound approach, it quickly identifies the most effective TAM configurations. Experiments using SoCs from industry highlight the benefits of the proposed technique on multi-Vdd designs, for both single-site and multi-site test applications.