Papers Published

1. Vijayan, A; Kiamehr, S; Ebrahimi, M; Chakrabarty, K; Tahoori, MB, Online soft-error vulnerability estimation for memory arrays and logic cores, Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems, vol. 37 no. 2 (February, 2018), pp. 499-511, Institute of Electrical and Electronics Engineers (IEEE) [doi] .
   (last updated on 2022/12/30)

   Abstract:
   Radiation-induced soft errors are a major reliability concern in circuits fabricated at advanced technology nodes. Online soft-error vulnerability estimation offers the flexibility of exploiting dynamic fault-tolerant mechanisms for cost-effective reliability enhancement. We propose a generic run-time method with low area and power overhead to predict the soft-error vulnerability of on-chip memory arrays as well as logic cores. The vulnerability prediction is based on signal probabilities (SPs) of a small set of flip-flops, chosen at design time, by studying the correlation between the soft-error vulnerability and the flip-flop SPs for representative workloads. We exploit machine learning to develop a predictive model that can be deployed in the system in software form. Simulation results on two processor designs show that the proposed technique can accurately estimate the soft-error vulnerability of on-chip logic core, such as sequential pipeline logic and functional units as well as memory arrays that constitute the instruction cache, the data cache, and the register file.