Papers Published

1. Fair, R.B., A wide slit scanning method for measuring electron and ion beam profiles, J. Phys. E, Sci. Instrum. (UK), vol. 4 no. 1 (1971), pp. 35 - 6 [008] .
   (last updated on 2007/04/17)

   Abstract:
   In order to eliminate the problem of calibration in beam spot size measurements, a wide slit scanning technique has been developed. As the beam scans across the edge of a slit, the ions or electrons are collected, and the resulting signal is displayed on an oscilloscope. This trace is a two-dimensional picture of the convolution of the beam with the slit edge. A mathematical analysis of the signal allows the intensity distribution of the beam to be obtained. Experimental verification of the technique is described

   Keywords:
   electron beams;ion beams;