Publications [#361569] of Anselm G. Vossen

Papers Published
  1. Abdesselam, A; Adachi, I; Adamczyk, K; Aihara, H; Said, SA; Arinstein, K; Arita, Y; Asner, DM; Aso, T; Aulchenko, V; Aushev, T; Ayad, R; Aziz, T; Babu, V; Badhrees, I; Bahinipati, S; Bakich, AM; Bala, A; Ban, Y; Bansal, V; Barberio, E; Barrett, M; Bartel, W; Bay, A; Bedny, I; Behera, P; Belhorn, M; Belous, K; Bhardwaj, V; Bhuyan, B; Bischofberger, M; Blyth, S; Bobrov, A; Bondar, A; Bonvicini, G; Bookwalter, C; Bozek, A; Bračko, M; Brodzicka, J; Browder, TE; Červenkov, D; Chang, M-C; Chang, P; Chao, Y; Chekelian, V; Chen, A; Chen, K-F; Chen, P; Cheon, BG; Chilikin, K; Chistov, R; Cho, K; Chobanova, V; Choi, S-K; Choi, Y; Cinabro, D; Crnkovic, J; Dalseno, J; Danilov, M; Carlo, SD; Dingfelder, J; Doležal, Z; Drásal, Z; Drutskoy, A; Dubey, S; Dutta, D; Dutta, K; Eidelman, S; Epifanov, D; Esen, S; Farhat, H; Fast, JE; Feindt, M; Ferber, T; Frey, A; Frost, O; Fujikawa, M; Fulsom, BG; Gaur, V; Gabyshev, N; Ganguly, S; Garmash, A; Getzkow, D; Gillard, R; Giordano, F; Glattauer, R; Goh, YM; Golob, B; Perdekamp, MG; Grygier, J; Grzymkowska, O; Guo, H; Haba, J; Hamer, P; Han, YL; Hara, K; Hara, T; Hasegawa, Y; Hasenbusch, J; Hayasaka, K; Hayashii, H; He, XH; Heck, M; Hedges, M; Heffernan, D; Heider, M; Heller, A; Higuchi, T; Himori, S; Horiguchi, T; Horii, Y; Hoshi, Y; Hoshina, K; Hou, W-S; Hsiung, YB; Huschle, M; Hyun, HJ; Igarashi, Y; Iijima, T; Imamura, M; Inami, K; Ishikawa, A; Itagaki, K; Itoh, R; Iwabuchi, M; Iwasaki, M; Iwasaki, Y; Iwashita, T; Iwata, S; Jaegle, I; Jones, M; Joo, KK; Julius, T; Kah, DH; Kakuno, H; Kang, JH; Kang, KH; Kapusta, P; Kataoka, SU; Katayama, N; Kato, E; Kato, Y; Katrenko, P; Kawai, H; Kawasaki, T; Kichimi, H; Kiesling, C; Kim, BH; Kim, DY; Kim, HJ; Kim, JB; Kim, JH; Kim, KT; Kim, MJ; Kim, SH; Kim, SK; Kim, YJ; Kinoshita, K; Kleinwort, C; Klucar, J; Ko, BR; Kobayashi, N; Koblitz, S; Kodyš, P; Koga, Y; Korpar, S; Kouzes, RT; Križan, P; Krokovny, P; Kronenbitter, B; Kuhr, T; Kumar, R; Kumita, T; Kurihara, E; Kuroki, Y; Kuzmin, A; Kvasnička, P; Kwon, Y-J; Lai, Y-T; Lange, JS; Lee, DH; Lee, IS; Lee, S-H; Leitgab, M; Leitner, R; Lewis, P; Li, J; Li, X; Li, Y; Gioi, LL; Libby, J; Limosani, A; Liu, C; Liu, Y; Liu, ZQ; Liventsev, D; Louvot, R; Lukin, P; MacNaughton, J; Matvienko, D; Matyja, A; McOnie, S; Mikami, Y; Miyabayashi, K; Miyachi, Y; Miyake, H; Miyata, H; Miyazaki, Y; Mizuk, R; Mohanty, GB; Mohanty, S; Mohapatra, D; Moll, A; Moon, HK; Mori, T; Moser, H-G; Müller, T; Muramatsu, N; Mussa, R; Nagamine, T; Nagasaka, Y; Nakahama, Y; Nakamura, I; Nakamura, K; Nakano, E; Nakano, H; Nakano, T; Nakao, M; Nakayama, H; Nakazawa, H; Nanut, T; Natkaniec, Z; Nayak, M; Nedelkovska, E; Negishi, K; Neichi, K; Ng, C; Niebuhr, C; Niiyama, M; Nisar, NK; Nishida, S; Nishimura, K; Nitoh, O; Nozaki, T; Ogawa, A; Ogawa, S; Ohshima, T; Okuno, S; Olsen, SL; Ono, Y; Onuki, Y; Ostrowicz, W; Oswald, C; Ozaki, H; Pakhlov, P; Pakhlova, G; Palka, H; Panzenböck, E; Park, C-S; Park, CW; Park, H; Park, HK; Park, KS; Peak, LS; Pedlar, TK; Peng, T; Pesantez, L; Pestotnik, R; Peters, M; Petrič, M; Piilonen, LE; Poluektov, A; Prasanth, K; Prim, M; Prothmann, K; Pulvermacher, C; Reisert, B; Ribežl, E; Ritter, M; Röhrken, M; Rorie, J; Rostomyan, A; Rozanska, M; Ryu, S; Sahoo, H; Saito, T; Sakai, K; Sakai, Y; Sandilya, S; Santel, D; Santelj, L; Sanuki, T; Sasao, N; Sato, Y; Savinov, V; Schneider, O; Schnell, G; Schönmeier, P; Schram, M; Schwanda, C; Schwartz, AJ; Schwenker, B; Seidl, R; Sekiya, A; Semmler, D; Senyo, K; Seon, O; Seong, I; Sevior, ME; Shang, L; Shapkin, M; Shebalin, V; Shen, CP; Shibata, T-A; Shibuya, H; Shinomiya, S; Shiu, J-G; Shwartz, B; Sibidanov, A; Simon, F; Singh, JB; Sinha, R; Smerkol, P; Sohn, Y-S; Sokolov, A; Soloviev, Y; Solovieva, E; Stanič, S; Starič, M; Steder, M; Stypula, J; Sugihara, S; Sugiyama, A; Sumihama, M; Sumisawa, K; Sumiyoshi, T; Suzuki, K; Suzuki, S; Suzuki, SY; Suzuki, Z; Takeichi, H; Tamponi, U; Tanaka, M; Tanaka, S; Tanida, K; Taniguchi, N; Tatishvili, G; Taylor, GN; Teramoto, Y; Thorne, F; Tikhomirov, I; Trabelsi, K; Trusov, V; Tse, YF; Tsuboyama, T; Uchida, M; Uchida, T; Uchida, Y; Uehara, S; Ueno, K; Uglov, T; Unno, Y; Uno, S; Urquijo, P; Ushiroda, Y; Usov, Y; Vahsen, SE; Hulse, CV; Vanhoefer, P; Varner, G; Varvell, KE; Vervink, K; Vinokurova, A; Vorobyev, V; Vossen, A; Wagner, MN; Wang, CH; Wang, J; Wang, M-Z; Wang, P; Wang, XL; Watanabe, M; Watanabe, Y; Wedd, R; Wehle, S; White, E; Wiechczynski, J; Williams, KM; Won, E; Yabsley, BD; Yamada, S; Yamamoto, H; Yamaoka, J; Yamashita, Y; Yamauchi, M; Yashchenko, S; Yelton, J; Yook, Y; Yuan, CZ; Yusa, Y; Zhang, CC; Zhang, LM; Zhang, ZP; Zhao, L; Zhilich, V; Zhulanov, V; Ziegler, M; Zivko, T; Zupanc, A; Zwahlen, N; Zyukova, O; Collaboration, TB, Measurement of the amplitude ratio of $B^0 \to D^0K^{*0}$ and $B^0 \to \bar{D^0}K^{*0}$ decays with a model-independent Dalitz plot analysis using $D\to K_S^0π^+π^-$ decays (February, 2015) .

    Abstract:
    We report a measurement of the amplitude ratio $r_S$ of $B^0 \to D^0K^{*0}$ and $B^0 \to \bar{D^0}K^{*0}$ decays with a model-independent Dalitz plot analysis using $D\to K_S^0\pi^+\pi^-$ decays. Using the full data sample of $772\times10^6$ $B\bar{B}$ pairs collected at the $\Upsilon(4S)$ resonance with the Belle detector at KEKB accelerator the upper limit is $r_S < 0.87$ at the 68 % confidence level. This result is the first measurement of $r_S$ with a model-independent Dalitz analysis, and is consistent with results from other analyses. The value of $r_S$ indicates the sensitivity of the decay to $\phi_3$ because the statistical uncertainty is proportional to $1/r_S$. The $r_S$ result is obtained from observables ($x_\pm$, $y_\pm$) \begin{eqnarray} x_- &=& +0.4 ^{+1.0 +0.0}_{-0.6 -0.1} \pm0.0 \\ y_- &=& -0.6 ^{+0.8 +0.1}_{-1.0 -0.0} \pm0.1 \\ x_+ &=& +0.1 ^{+0.7 +0.0}_{-0.4 -0.1} \pm0.1 \\ y_+ &=& +0.3 ^{+0.5 +0.0}_{-0.8 -0.1} \pm0.1 \\ , \end{eqnarray} where $x_\pm = r_S \cos(\delta_S \pm \phi_3)$, $y_\pm = r_S \sin(\delta_S \pm \phi_3)$ and $\phi_3 (\delta_S)$ are the weak (strong) phase difference between $B^0 \to D^0K^{*0}$ and $B^0 \to \bar{D^0}K^{*0}$. The first uncertainty is statistical, the second is the experimental systematic and the third is the systematic due to the uncertainties on $c_i$ and $s_i$ parameters measured by CLEO.

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