Abstract:
A new ultrahigh-resolution photoemission
electron microscope called PEEM3 is being
developed at the advanced light source (ALS).
An electron mirror combined with a
sophisticated magnetic beam separator is used
to provide simultaneous correction of
spherical and chromatic aberrations.
Installed on an elliptically polarized
undulator beamline, PEEM3 will be operated
with very high spatial resolution and high
flux to study the composition, structure,
electric and magnetic properties of complex
materials.
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