Publications [#314058] of Henry Everitt

Papers Published

1. Özgür, U; Webb-Wood, G; Everitt, HO; Yun, F; Morkoç, H, Systematic measurement of AlxGa1-xN refractive indices, Applied Physics Letters, vol. 79 no. 25 (December, 2001), pp. 4103-4105, AIP Publishing, ISSN 0003-6951 [Gateway.cgi], [doi]
   (last updated on 2025/11/07)

   Abstract:
   Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic AlxGa1-xN epitaxial layers with 0.0≤x≤1.0 throughout the visible wavelength region. The dispersion, measured by a prism coupling waveguide technique, is found to be well described by a Sellmeier relation. Discrepancies among previous measurements of refractive index dispersion, as a consequence of different growth conditions and corresponding band gap bowing parameter, are reconciled when the Sellmeier relation is parameterized not by x but by band gap energy. © 2001 American Institute of Physics.