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Pratt School of Engineering
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Publications [#314102] of Henry Everitt

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Papers Published

  1. Webb-Wood, G; Özgür, U; Everitt, HO; Yun, F; Morkoç, H, Measurement of AlxGa1-xN Refractive Indices, in Physica Status Solidi A-Applications And Materials Science, Physica Status Solidi A Applied Research, vol. 188 no. 2 (November, 2001), pp. 793-797, WILEY-V C H VERLAG GMBH, ISSN 0031-8965 [Gateway.cgi], [doi]
    (last updated on 2025/11/07)

    Abstract:
    Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic AlxGa1-xN epitaxial layers with 0 ≤ x ≤ 1.0 throughout the visible wavelength region 457 nm < λ < 800 nm. The dispersion, measured by a prism coupling waveguide technique is found to be well described by a first-order Sellmeier dispersion formula parameterized as functions of x and λ.


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