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| Publications [#347338] of Glenn S. Edwards
Papers Published
- Mu, R; Henderson, DO; Johnson, JB; Edwards, GS, Pulsed JR-FEL applications for the characterization of infrared optical materials,
Proceedings of SPIE - The International Society for Optical Engineering, vol. 2138
(July, 1994),
pp. 97-106 [doi]
(last updated on 2024/12/31)
Abstract: Theoretical consideration of thermal lens effect due to linear and nonlinear opiical absorption is presented. Based on this model, Zscan technique, especially two-color Z-scan can be used to detect very low level of unpurities or defects in optical materials. Depending upon the optical crs section of the particular species being probed, two-color Z-scan can detect impurities, for example, the OH groups in fused silica at sub-ppm level by weight or better.
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