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| Publications [#245185] of Harold U. Baranger
Papers Published
- Baranger, HU; Wilkins, JW, Ballistic electrons in an inhomogeneous submicron structure: Thermal and contact effects,
Physical Review B, vol. 30 no. 12
(January, 1984),
pp. 7349-7351, American Physical Society (APS), ISSN 0163-1829 [p7349], [doi]
(last updated on 2026/01/15)
Abstract: For a simple submicron semiconductor structure we have calculated exactly the electron distribution f(v,x) within a relaxation-to-local-equilibrium assumption for the collision term of the Boltzmann equation. This is the first calculation of the electron distribution in an inhomogeneous semiconductor. Large applied voltages produce a substantial ballistic peak in f(v,x). But at all voltages contact inhomogeneities and local heating (and cooling) produce an I-V characteristic only weakly dependent on the scattering rate. © 1984 The American Physical Society.
Keywords: SEMICONDUCTOR MATERIALS; TRANSPORT THEORY; ELECTRON SPECTRA; MICROSTRUCTURE; DIFFUSION; ELECTRIC CONTACTS; DEBYE LENGTH; BOLTZMANN EQUATION; TEMPERATURE EFFECTS
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