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| Publications [#67570] of Richard B. Fair
Papers Published
- Fair, R.B., High concentration arsenic diffusion in silicon from a doped oxide source,
J. Electrochem. Soc. (USA), vol. 119 no. 10
(1972),
pp. 1389 - 94
(last updated on 2007/04/17)
Abstract: The properties of As-doped SiO2 and As-doped Ge/SiO2 diffusion sources as a function of the O2 concentration in a horizontal, open-tube deposition chamber are examined
Keywords: arsenic;diffusion in solids;germanium compounds;semiconductor doping;silicon;silicon compounds;
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