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| Publications [#67588] of Richard B. Fair
Papers Published
- Fair, R.B., Quantitative theory of retarded base diffusion in silicon n-p-n structures with arsenic emitters,
J. Appl. Phys. (USA), vol. 44 no. 1
(1973),
pp. 283 - 91
(last updated on 2007/04/17)
Abstract: When As is sequentially diffused into Ga or B-doped Si, a retardation of the p-type base layer is generally observed. This is in contrast to the `emitter-push' effect associated with sequential phosphorus diffusions. In order to simulate transistor profiles it is necessary to be able to quantitatively describe the emitter-base interactions during diffusion. The way in which the internal electric field the equilibrium vacancy density, ion pairing, and the rate of [VSiAS2] complex formation affect the redistribution of the base layer during sequential processing was investigated
Keywords: arsenic;bipolar transistors;diffusion in solids;semiconductor doping;silicon;
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