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| Publications [#234300] of Warren S. Warren
Journal Articles
- Huang, F; Federici, JF; Gary, D; Jedju, T; Warren, WS, Determining thickness independently from optical constants using ultrafast spectral interferometry,
2005 Conference on Lasers and Electro Optics CLEO, vol. 2
(December, 2005),
pp. 1103-1105, ISSN 2162-2701
(last updated on 2026/01/14)
Abstract: We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.
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