MEMP : Publications since January 2025

Cocks, Franklin H.

1. Flournoy, T.H. and Cocks, F.H. and Affronti, J., Fracture strength of human gallstones, J. Mater. Sci. Lett. (UK), vol. 10 no. 18 (15), pp. 1066 - 8  [abs]
2. Cocks, F.H., Grain boundary cleavage and the stress corrosion of high-strength aluminium alloys, Metallography (USA), vol. 2 no. 2-3 , pp. 247 - 52  [abs]
3. Wong, D. and Cocks, F.H., Aluminum pitting corrosion in aqueous glycol solutions: characteristics and relevance to solar thermal collector systems, Corrosion (USA), vol. 36 no. 9 , pp. 513 - 14  [abs]
4. Cocks, F.H. and Pollock, J.T.A., Single-crystal thermoluminescent lithium fluoride for dosimetry prepared by an edge-defined film-fed growth (EFG) technique, J. Appl. Phys. (USA), vol. 43 no. 9 , pp. 3878 - 80  [abs]
5. Cocks, F.H. and Stormont, R.W., Rutile substructures in barium magnesium titanate, J. Am. Ceram. Soc. (USA), vol. 55 no. 9 , pp. 479 - 80  [abs]
6. Cocks, F.H. and Peterson, M.J., Tellurium and selenium selective absorber thin films produced by gas-evaporation methods, J. Vac. Sci. Technol. (USA), vol. 16 no. 5 , pp. 1560 - 3 [1.570248]  [abs]
7. Moore, K.D. and Cocks, F.H. and Jones, P.L., Positron evaluation of hydrogen in a 17 nickel maraging steel, J. Test. Eval. (USA), vol. 11 no. 5 , pp. 309 - 11  [abs]

Glass, Jeffrey T.

1. Ma, S. Y. and Chen, H. X. and Glass, J. T. and Parker, C. B. and Li, Y. and Laudon, M. and Romanowicz, B., Influence of Al-doping and Oxygen Partial Pressure on the Optical Properties of ZnO Films, Nanotech Conference & Expo 2009, Vol 1, Technical Proceedings (2009), pp. 273--276
2. Natarajan, Srividya and Parker, Charles B. and Glass, Jeffrey T. and Bower, Christopher A. and Gilchrist, Kristin H. and Piascik, Jeffrey R. and Stoner, Brian R. and IEEE, High voltage MEMS platform for fully integrated, on-chip, vacuum electronic devices, 2008 Ieee International Vacuum Electronics Conference (2008), pp. 24--25
3. X. D. Zhang and J. S. Lewis and S. D. Wolter and C. B. Parker and J. T. Glass, High sensitivity permeation measurement system for "ultrabarrier" thin films, Journal Of Vacuum Science & Technology A, vol. 25 no. 6 (2007), pp. 1587 -- 1593, ISSN 0734-2101  [abs]
4. LIU, J. and ZHIRNOV, VV and MYERS, AF and WOJAK, GJ and CHOI, WB and HREN, JJ and WOLTER, SD and MCCLURE, MT and GLASS, JT and VIDE, SOC FRANCAISE, DIAMOND-COATED SILICON FIELD EMITTERS, Ivmc 94 - 7th International Vacuum Microelectronics Conference (1994), pp. 104--107
5. Kohl, R. and Wild, C. and Herres, N. and Koidl, P. and Stoner, B.R. and Glass, J.T., Oriented nucleation and growth of diamond films on β-SiC and Si, Appl. Phys. Lett. (USA), vol. 63 no. 13 (27), pp. 1792 - 4 [1.110664]  [abs]
6. Kong, H.S. and Glass, J.T. and Davis, R.F., Chemical vapor deposition and characterization of 6H-SiC thin films on off-axis 6H-SiC substrates, J. Appl. Phys. (USA), vol. 64 no. 5 (1), pp. 2672 - 9 [1.341608]  [abs]